Schoneiche, Germany

Markus Lankers

USPTO Granted Patents = 3 

 

Average Co-Inventor Count = 3.8

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Berlin, DE (2006)
  • Schoneiche, DE (2018 - 2021)

Company Filing History:


Years Active: 2006-2021

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Markus Lankers

Introduction

Markus Lankers is a notable inventor based in Schoneiche, Germany. He has made significant contributions to the field of microscopic imaging and material analysis, holding a total of 3 patents. His work focuses on enhancing the capabilities of microscopy and spectroscopic measurements, particularly in biological samples.

Latest Patents

One of Lankers' latest patents is a liquid cell designed for microscopic imaging and Raman spectroscopic material analysis of particle suspensions. This invention features a measuring chamber with a base and a measuring window, where the base has a reflective surface that optimizes Raman excitation light. This design effectively reduces background signals during measurements, thereby increasing the Raman signal of particles in suspension. Another significant patent is a system and method for confocal Raman-spectroscopic measurements of biological samples. This system allows for the detection of minute amounts of microbes while maintaining a large working distance between the objective lens and the sample, enabling measurements through the lid of the sample chamber.

Career Highlights

Throughout his career, Markus Lankers has worked with several companies, including Rap.id Particle Systems GmbH and Unchained Labs. His experience in these organizations has contributed to his expertise in the development of innovative measurement systems.

Collaborations

Lankers has collaborated with notable professionals in his field, including Oliver Valet and Lothar Holz. These collaborations have likely enriched his work and led to advancements in his inventions.

Conclusion

Markus Lankers is a distinguished inventor whose work in microscopy and material analysis has led to valuable innovations. His patents reflect a commitment to improving scientific measurement techniques, making significant contributions to the field.

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