The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Dec. 15, 2016
Applicant:
Unchained Labs, Pleasanton, CA (US);
Inventors:
Karsten Goede, Berlin, DE;
Lothar Holz, Berlin, DE;
Markus Lankers, Schoneiche, DE;
Oliver K. Valet, Berlin, DE;
Assignee:
UNCHAINED LABS, Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 33/483 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/03 (2013.01); G01N 21/65 (2013.01); G01N 33/483 (2013.01); G01N 2021/0385 (2013.01); G01N 2201/0846 (2013.01); G01N 2201/10 (2013.01);
Abstract
Disclosed herein is a system, particularly a microscope system, for confocal Raman-spectroscopic measurements. The system is configured to detect minute sample amounts of microbes in a sample chamber with a lid, wherein the system is configured such that a comparably large working distance between the objective lens and the sample is sustained such that a measurement can be performed through the lid of the sample chamber. This allows for cultivating and measuring the sample in the same container.