Princeton, NJ, United States of America

Mark Limes

This inventor holds 2 USPTO granted patents. Top assignee: Princeton University. Active years: 2024-2026.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Mark Limes: Innovator in Atomic Magnetometry

Introduction

Mark Limes is a distinguished inventor based in Princeton, NJ (US). He has made significant contributions to the field of atomic magnetometry, holding a total of 2 patents. His work focuses on advancing the precision and reliability of magnetic field measurements.

Latest Patents

Limes' latest patents include a "Pulsed vector magnetometer using a fast rotating field." This invention addresses the limitations of traditional atomic magnetometers, which are typically used as scalar sensors. By converting the magnetic field into a measurable frequency, Limes' method allows for high fractional precision in measuring vector magnetic field components. Additionally, he has developed a "System and method for heading error correction in a pulsed Rb-87 magnetometer at geomagnetic fields." This patent outlines a technique for reducing heading error by varying the direction and magnitude of the magnetic field during different spin polarization regimes.

Career Highlights

Mark Limes is affiliated with Princeton University, where he continues to push the boundaries of research in magnetometry. His innovative approaches have garnered attention in the scientific community, contributing to advancements in various applications.

Collaborations

Limes has collaborated with notable colleagues, including Wonjae Lee and Elizabeth Foley. Their combined expertise enhances the research and development of new technologies in the field.

Conclusion

Mark Limes is a prominent figure in the realm of atomic magnetometry, with a focus on improving measurement techniques. His contributions are paving the way for future innovations in magnetic field sensing.

Profile summary based on public USPTO records.
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