The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Oct. 03, 2022
The Trustees of Princeton University, Princeton, NJ (US);
Twinleaf Llc, Plainsboro, NJ (US);
Tao Wang, Princeton, NJ (US);
Wonjae Lee, Princeton, NJ (US);
Michael Romalis, Princeton, NJ (US);
Mark Limes, Princeton, NJ (US);
Thomas Kornack, Plainsboro, NJ (US);
Elizabeth Foley, Plainsboro, NJ (US);
Trustees of Princeton University, Princeton, NJ (US);
Abstract
Atomic magnetometers are usually used as scalar sensors to measure the magnitude of the magnetic field. The magnetic field is converted to a frequency that can be measured with high fractional precision. There are no comparable methods for measuring vector magnetic field components. Common sensors, such as flux-gate and SQUID magnetometers, suffer from calibration and orthogonality uncertainty. Disclosed is a method of using an atomic magnetometer to measure the magnitude and two polar angles of the magnetic field vector. The two polar angles are dimensionless quantities and can be measured with high fractional precision. Also disclosed is a particular measurement procedure that is immune to systematic effects in such measurements.