Euless, TX, United States of America

Marion W Neff


Average Co-Inventor Count = 1.4

ph-index = 6

Forward Citations = 228(Granted Patents)


Location History:

  • Arlington, TX (US) (1978)
  • Irving, TX (US) (1977 - 1979)
  • Euless, TX (US) (1978 - 1991)
  • Dallas, TX (US) (1997)

Company Filing History:


Years Active: 1977-1997

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7 patents (USPTO):Explore Patents

Title: The Innovative Mind of Marion W Neff

Introduction:

Marion W Neff, a prolific inventor hailing from Euless, TX, has made significant contributions to the world of technology with a total of 7 patents under his belt.

Latest Patents:

Among his recent innovations is the 'Dichotomous scan system for detection of overlapped objects,' a cutting-edge apparatus and method designed to detect overlapped objects moving along a defined path by utilizing light sensors. Additionally, Neff developed the 'Bar code location and recognition processing system,' revolutionizing the way bar codes are located and read through optical scanning and digital image processing techniques.

Career Highlights:

Neff's inventive spirit shone through during his tenure at Recognition Equipment Incorporated and Electrocom Automation, where he played a pivotal role in developing groundbreaking technologies that reshaped the industry.

Collaborations:

Throughout his career, Neff collaborated closely with industry peers such as Richard G Van Tyne and George R Mondie, pooling their collective expertise to drive innovation and technological advancement.

Conclusion:

Marion W Neff stands out as a visionary inventor whose dedication to pushing the boundaries of technology has left an indelible mark on the industry. His pioneering work continues to inspire future generations of inventors and innovators.

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