The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 1997

Filed:

Jun. 07, 1995
Applicant:
Inventors:

George R Mondie, Bedford, TX (US);

Richard G Van Tyne, Richardson, TX (US);

Marion W Neff, Dallas, TX (US);

Assignee:

ElectroCom Automation L.P., Arlington, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06M / ;
U.S. Cl.
CPC ...
2502 / ; 377-8 ;
Abstract

Apparatus and method are disclosed for detection of overlapped objects moving along a defined path. A light radiation source directs a light beam toward the path. As an object moves into the light beam, reflected light is received by two light sensors. An edge of an overlapping object moving along the defined path substantially blocks the light reflected from the underlying object from being received by one light sensor. The edges of an overlapping object are detected when a there is a difference in the amount of reflected light received by the light sensors and there exists a substantial rate of change in the amount of reflected light (indicative of a true edge of an overlapping object as opposed to warps, wrinkles, creases, etc. on the surface of an object) received by either light sensor due to the substantial blockage of reflected light by the edge.


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