Leipzig, Germany

Mario Berlinger

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Bühler Alzenau Gmbh. Active years: 2025.


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Mario Berlinger

Introduction

Mario Berlinger is a notable inventor based in Leipzig, Germany. He has made significant contributions to the field of measurement systems, particularly in the area of ion beam etching and deposition. His work is characterized by a focus on precision and efficiency, which is essential in various industrial applications.

Latest Patents

Mario Berlinger holds a patent for an "In-situ etch rate or deposition rate measurement system." This innovative system includes a vacuum chamber and an ion beam source that directs an ion beam onto a sample's surface. The system is designed to measure the etch rate or deposition rate in real-time, utilizing an interferometric measurement device to analyze light reflected from the sample. This technology enhances the accuracy of material processing in various applications.

Career Highlights

Mario is currently employed at Bühler Alzenau GmbH, where he continues to develop cutting-edge technologies. His expertise in measurement systems has positioned him as a valuable asset to the company. With a focus on innovation, he has contributed to advancements that improve manufacturing processes and product quality.

Collaborations

Throughout his career, Mario has collaborated with talented professionals, including Steffen Guertler and Ralf Sperling. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of new technologies.

Conclusion

Mario Berlinger exemplifies the spirit of innovation through his work in measurement systems. His contributions have the potential to significantly impact various industries, showcasing the importance of precision in technology.

Profile summary based on public USPTO records.
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