Erlangen, Germany

Maria V Chekhova



Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Maria V Chekhova: Innovator in Calibration Technology.

Introduction

Maria V Chekhova is a notable inventor based in Germany, recognized for her contributions to the field of calibration technology. Her innovative work focuses on enhancing the accuracy and efficiency of measuring instruments through advanced methodologies.

Latest Patents

One of her significant patents is titled "Apparatus And Method For Calibrating Measuring Instruments." This invention provides a method and apparatus for implementing a parametric down-conversion (PDC)-based calibration. The process involves calibrating a measuring instrument, positioning a pinhole at the location of a light-emitting sample, and irradiating a nonlinear crystal with a light source. The method ensures that the phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth. The measuring instrument acquires one or more PDC spectrums, from which peak values and their corresponding wavelengths are obtained. Finally, a response function is derived based on these peak values and wavelengths.

Career Highlights

Throughout her career, Maria has demonstrated a commitment to advancing measurement technologies. Her work has been instrumental in developing methods that improve the precision of various scientific instruments. Despite having no patents listed under her name, her contributions to the field are noteworthy.

Collaborations

Maria has collaborated with esteemed colleagues, including Mathieu Manceau and Robert W Boyd. These partnerships have fostered innovation and have led to significant advancements in calibration techniques.

Conclusion

Maria V Chekhova is a pioneering inventor whose work in calibration technology has the potential to impact various scientific fields. Her innovative methods and collaborative spirit continue to inspire advancements in measurement accuracy.

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