The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Oct. 17, 2017
University of Ottawa, Ottawa, Ontario, CA;
Max-planck-gesellschaft Zur Forderung Der Wissenschaften E.v., Munich, DE;
Friedrich-alexander-universitaet Erlangen-nuernberg, Erlangen, DE;
Samuel Lemieux, Ottawa, CA;
Mathieu Manceau, Erlangen, DE;
Robert W. Boyd, Rochester, NY (US);
Gerd Leuchs, Erlangen, DE;
Maria V. Chekhova, Erlangen, DE;
University of Ottawa, Ottawa, CA;
Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V., Munich, DE;
Friedrich-Alexander-Universitaet Erlangen-Nuernberg, Erlangen, DE;
Abstract
A method and apparatus is provided for implementing a parametric down-conversion (PDC)-based calibration comprising calibrating a measuring instrument; disposing a pinhole at a position of a light-emitting sample for which the measuring instrument needs to be calibrated; irradiating a nonlinear crystal with a light source; setting the nonlinear crystal by ensuring a phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth; acquiring one or more PDC spectrums by the measuring instrument; obtaining peak values and their corresponding wavelengths from each acquired spectrum; and obtaining a response function based on the peak values and corresponding wavelengths.