Tallinn, Estonia

Marek Rist

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Tallinn University of Technology. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marek Rist. Retrieved from https://idiyas.com/inventor/marek-rist

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 66.7

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Marek Rist

Introduction

Marek Rist is a notable inventor based in Tallinn, Estonia. He has made significant contributions to the field of measurement electronics, particularly in the measurement of complex transfer functions. His work is characterized by a focus on precision and the ability to measure small changes in the characteristics of objects under test.

Latest Patents

Marek Rist holds a patent for a device and method for measuring the complex transfer function of an object. This invention addresses the challenges of measuring complex transfer functions, such as impedance, especially in the presence of large disturbances. The innovative approach involves detuning the excitation and reference signals, which includes adding an incremental phase shift to the excitation signal to generate the reference signal.

Career Highlights

Marek Rist is affiliated with Tallinn University of Technology, where he contributes to research and development in measurement electronics. His expertise and innovative mindset have positioned him as a valuable asset in his field.

Collaborations

Marek has collaborated with notable colleagues, including Paul Annus and Raul Land. Their combined efforts in research and development have further advanced the field of measurement electronics.

Conclusion

Marek Rist's contributions to measurement electronics through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances measurement techniques but also paves the way for future innovations in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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