The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Dec. 19, 2020
Applicant:

Tallinn University of Technology, Tallinn, EE;

Inventors:

Paul Annus, Tallinn, EE;

Raul Land, Tallinn, EE;

Mart Min, Tallinn, EE;

Olev Märtens, Tallinn, EE;

Marek Rist, Tallinn, EE;

Eiko Priidel, Tallinn, EE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); A61B 5/0537 (2021.01); G01R 25/04 (2006.01);
U.S. Cl.
CPC ...
G01R 25/005 (2013.01); A61B 5/0537 (2013.01); G01R 25/04 (2013.01);
Abstract

The invention is related to the field of measurement electronics and related to the measurement of complex transfer functions (e.g. of impedance), especially in the presence of large disturbances and for measuring of small changes of the characteristics of the object under test. The goals of the proposed invention are achieved by detuning of the excitation and reference signals, e.g. by adding incremental phase-shift to the excitation signal to generate the reference signal.


Find Patent Forward Citations

Annus, Paul. (2025). Device and method for measuring of the complex transfer function of an object (U.S. Patent No. 12345749). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12345749

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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