Marcus Diem

Title: Innovations by Marcus Diem

Introduction

Marcus Diem is a notable inventor based in Haar, Germany. He has made significant contributions to the field of scanning probe microscopy, particularly in the area of optical interaction measurements. With a total of two patents to his name, Diem's work showcases his expertise and innovative spirit.

Latest Patents

One of Marcus Diem's latest patents is titled "Active bimodal AFM operation for measurements of optical interaction." This invention relates to a method for measuring the dielectric properties of a sample using a scanning probe microscope. It focuses on highly-localized optical imaging and spectroscopy on a sample surface, utilizing an atomic force microscope (AFM) probe that is mechanically driven at two oscillation frequencies, referred to as 'active bimodal operation,' along with a modulated source of electromagnetic radiation. Another significant patent is "Method for referencing a near-field measurement with drift and fluctuation correction." This invention provides a method for referencing near-field measurements, particularly in a scanning probe microscope, addressing issues related to drift and fluctuations.

Career Highlights

Marcus Diem is currently associated with Attocube Systems AG, a company known for its cutting-edge technology in the field of nanotechnology and measurement systems. His work at Attocube Systems AG has allowed him to further develop his innovative ideas and contribute to advancements in scientific research.

Collaborations

Throughout his career, Marcus Diem has collaborated with talented individuals such as Alexander A Govyadinov and Florian Huth. These collaborations have enriched his work and fostered a creative environment for innovation.

Conclusion

Marcus Diem's contributions to the field of scanning probe microscopy and his innovative patents highlight his role as a significant inventor. His work continues to influence advancements in optical interaction measurements and nanotechnology.