The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Apr. 09, 2020
Applicant:
Attocube Systems Ag, Haar, DE;
Inventors:
Alexander A. Govyadinov, Haar, DE;
Florian Huth, Haar, DE;
Ivan Malovichko, Haar, DE;
Marcus Diem, Haar, DE;
Assignee:
ATTOCUBE SYSTEMS AG, Haar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/34 (2010.01); G01Q 30/02 (2010.01); G01Q 60/30 (2010.01); G01Q 60/36 (2010.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/34 (2013.01); G01Q 30/02 (2013.01); G01Q 60/30 (2013.01); G01Q 60/363 (2013.01); G01Q 60/38 (2013.01);
Abstract
The present invention relates to a method for measuring the dielectric properties of a sample with a scanning probe microscope. In particular, the invention relates to highly-localized optical imaging and spectroscopy on a sample surface using an atomic force microscope (AFM) probe mechanically driven at two oscillation frequencies, referred to herein as 'active bimodal operation', and a modulated source of electromagnetic radiation.