Ivan Malovichko

Title: Ivan Malovichko: Innovator in Scanning Probe Microscopy

Introduction

Ivan Malovichko is a notable inventor based in Haar, Germany. He has made significant contributions to the field of scanning probe microscopy, particularly in the area of optical interaction measurements. With a total of two patents to his name, Malovichko continues to push the boundaries of innovation in his field.

Latest Patents

Malovichko's latest patents include "Active bimodal AFM operation for measurements of optical interaction" and "Method for referencing a near-field measurement with drift and fluctuation correction." The first patent describes a method for measuring the dielectric properties of a sample using a scanning probe microscope. This invention focuses on highly-localized optical imaging and spectroscopy on a sample surface, utilizing an atomic force microscope (AFM) probe that operates at two oscillation frequencies. The second patent addresses a method for referencing near-field measurements, which is crucial for enhancing the accuracy of scanning probe microscopy.

Career Highlights

Ivan Malovichko is currently employed at Attocube Systems AG, a company known for its cutting-edge technology in the field of microscopy and nanotechnology. His work at Attocube has allowed him to develop innovative solutions that enhance the capabilities of scanning probe microscopy.

Collaborations

Throughout his career, Malovichko has collaborated with talented individuals such as Alexander A Govyadinov and Florian Huth. These collaborations have contributed to the advancement of research and development in their respective fields.

Conclusion

Ivan Malovichko is a distinguished inventor whose work in scanning probe microscopy has led to significant advancements in optical interaction measurements. His patents reflect his commitment to innovation and excellence in scientific research.