Company Filing History:
Years Active: 1993-2022
Title: Marcel Niestadt: Innovator in Charged Particle Systems
Introduction
Marcel Niestadt is a prominent inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of charged particle systems, holding a total of 5 patents. His work focuses on correcting aberrations in charged particle microscopes, which are crucial for enhancing imaging quality in various scientific applications.
Latest Patents
One of Niestadt's latest patents is titled "Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems." This invention includes a first corrective component that generates a first quadrupole field when a first excitation is applied. Additionally, a second corrective component generates a second quadrupole field with a second excitation. The system also features a quadrupole positioned between the second corrective component and the sample, which generates a third quadrupole field. Together, these components correct fifth-order, two-fold aberrations during the operation of charged particle microscopes.
Another notable patent is "Sixth-order and above corrected STEM multipole correctors." This invention addresses axial aberrations in particle-optical lenses within charged particle microscope systems. It includes a first primary multipole that generates a primary multipole field and a second primary multipole that generates a second field. The design ensures that the first primary multipole is not imaged onto the second, preventing the creation of a combination fourth-order aberration. The correctors also incorporate secondary and tertiary multipoles for correcting higher-order aberrations.
Career Highlights
Throughout his career, Marcel Niestadt has worked with notable companies such as U.S. Philips Corporation and FEI Company. His experience in these organizations has allowed him to develop innovative solutions in the field of charged particle systems.
Collaborations
Niestadt has collaborated with esteemed colleagues, including Johannes Hm Damen and Hermanus N Tuin. Their combined expertise has contributed to advancements in the technology surrounding charged particle microscopy.
Conclusion
Marcel Niestadt's contributions to the field of charged particle systems are significant and impactful. His innovative patents and collaborations highlight his dedication to advancing technology in microscopy. His work continues to influence the scientific community and improve imaging techniques.