U.S. Philips Corporation

Fei Comapny

Marcel Niestadt

Alexander Henstra

Hermanus N Tuin

Johannes Hm Damen

Peter Christiaan Tiemeijer

Johannes M Van Esdonk

Franciscus M Van Laarhoven

Maarten A Van Andel

Cornelus Hm Van Bommel

Johannes Th Leijten

Wilhelmus Nm Selten

Rudolf O Lobel

Martinus Gfc Sanders

Correctors for correcting two-fold, fifth-order parasitic aberrations in charged particle systems according to the present disclosure include a first corrective component that generates a first quadrupole field when a first excitation is applied to the first corrective component, and a second corrective component that generates a second quadrupole field when a second excitation is applied to the second corrective component. Correctors according to the present disclosure also include a quadrupole positioned between the second corrective component and the sample when used in the charged particle microscope system that generates a third quadrupole field. The third quadrupole field, in combination with at least the first quadrupole field and the second quadrupole field, corrects the fifth-order, two-fold aberrations when the charged particle microscope is in use.

Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems

Correctors for correcting axial aberrations of a particle-optical lens in a charged particle microscope system, according to the present disclosure include a first primary multipole that generates a first primary multipole field when a first excitation is applied to the first primary multipole, and a second primary multipole that generates a second primary multipole field when a second excitation is applied to the second primary multipole. The first primary multipole is not imaged onto the second primary multipole such that a combination fourth-order aberration is created. The correctors further include a secondary multipole for correcting the fourth-order aberration and the sixth-order aberration. Such correctors may further include a tertiary multipole for correcting an eighth-order aberration.

Sixth-order and above corrected STEM multipole correctors

The thin-type display device (1) has a transparent front wall (3), which is provided with a display screen, and a rear wall (24) which extends parallel to said front wall (3), and said display device comprises at least an electron source and a duct structure. The display device (1) is characterized in that the rear wall (24) and walls (22, 22', 22') of the ducts of the duct structure are manufactured in a single piece. Preferably, the walls (22, 22', 22') of the ducts widen in the direction of the rear wall (24), with the angle, which opposing faces of the walls (22, 22', 22') of the ducts make with each other, ranging from 1.degree. to 30.degree.. Preferably, the rear wall (24) further comprises at least an upright side wall (32), which is integral with the rear wall (24). Preferably, the walls (22, 22', 22') are made from a glass having a temperature interval between the operating temperature and the softening temperature of less than 420.degree., perferably less than 360.degree., and the duct structure and the side walls (32) can be pressed in one process step.

Thin-type display device with one-piece rear wall

The inner surface of a cathode ray tube is roughened by blasting the surface with a suspension which comprises radiation particles, the inner surface being irradiated in such a manner that it satisfies the inequalities 0.05 .mu.m&lt;R.sub.a &lt;0.5 .mu.m and R.sub.z &lt;4 .mu.m and, preferably, 0.1 .mu.m&lt;R.sub.a &lt;0.2 .mu.m. The reflection at such a surface is comparable to the reflection at an etched surface. The method in accordance with the invention is safer and less harmful to the environment.

Method of manufacturing a display window for a cathode ray tube and a

To reduce reflection at a surface of a cathode ray tube display window, the surface is provided with a pattern of irregularities formed by ultraviolet laser radiation. Preferably the inside surface of the display window of the cathode ray tube is treated with the pattern of irregularities followed by a phosphor pattern over the treated surface. In one embodiment, a transmission grating is used to pass ultraviolet radiation to form the irregularities.

Method of manufacturing a display window for a display device

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Eindhoven, Netherlands

Marcel Niestadt