Enschede, Netherlands

Marcel Dijkstra

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Berkin B.v.. Active years: 2011-2014.


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2011-2014

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2 patents (USPTO):Explore Patents

Title: Marcel Dijkstra: Innovator in Flow Measurement Technology

Introduction

Marcel Dijkstra is a notable inventor based in Enschede, Netherlands. He has made significant contributions to the field of flow measurement technology, holding 2 patents that showcase his innovative approach to solving complex problems in this area.

Latest Patents

Dijkstra's latest patents include a flow meter designed for determining the flow of a medium. This invention features a flow tube that transports the medium, equipped with a first flow sensor and a second flow sensor positioned at different points along the tube. This design allows for accurate measurement of the medium's flow. Another patent involves a flowmeter that incorporates a system chip with a silicon substrate. This flowmeter includes a silicon flow tube for transporting the medium, which is integrated into a Coriolis flow sensor and/or a thermal flow sensor, enhancing its measurement capabilities.

Career Highlights

Marcel Dijkstra is associated with Berkin B.V., where he applies his expertise in flow measurement technology. His work has contributed to advancements in the efficiency and accuracy of flow measurement systems, making a significant impact in various industries.

Collaborations

Dijkstra has collaborated with notable colleagues such as Theodorus Simon Josef Lammerink and Jeroen Haneveld. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Marcel Dijkstra's contributions to flow measurement technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of flow measurement systems.

Profile summary based on public USPTO records.
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