This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Isra Vision Ag. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Innovator Marc Luxen: Pioneering Surface Inspection Technology
Introduction
Marc Luxen, a prominent inventor based in Aachen, Germany, has made significant strides in the field of surface inspection technology. With a strong focus on enhancing the quality and reliability of surface analysis, Luxen's contributions are noteworthy in the innovation landscape.
Latest Patents
Marc Luxen holds a patent for a "Method and a device for the inspection of surfaces of an examined object." This innovative method involves illuminating the surface with an illumination unit and capturing an image using an area image sensor. The captured images are subsequently analyzed by an image analysis unit designed to detect surface anomalies and identify defect areas. This technology not only segments these defect areas relative to their surroundings but also conducts comprehensive regional analyses and feature extraction to highlight characteristic defects.
Career Highlights
Luxen is currently affiliated with ISRA VISION AG, a company renowned for its advanced image processing technology and automation solutions. His work at ISRA VISION AG allows him to leverage his expertise in developing cutting-edge methods that contribute to improved inspection processes across various industries.
Collaborations
In his professional journey, Marc has collaborated with notable colleagues, including Jan Erxleben. This teamwork fosters an environment of innovation where ideas can flourish, leading to breakthroughs in surface inspection technology.
Conclusion
Marc Luxen's dedication to refining surface inspection methods showcases his commitment to technological advancement. With his patent and collaborative efforts at ISRA VISION AG, he continues to influence the future of surface analysis, ensuring higher standards and efficiencies in quality control across different sectors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile