The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
May. 14, 2013
Applicant:
Isra Vision Ag, Darmstadt, DE;
Inventors:
Marc Luxen, Aachen, DE;
Jan Erxleben, Wuerselen, DE;
Assignee:
ISRA VISION AG, Darmstadt, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01B 11/30 (2013.01); G01B 11/303 (2013.01);
Abstract
A method and a device for the inspection of surfaces of an examined object includes illuminating a the surface using an illumination unit and capturing an image of the surface using an area image sensor. The captured images are forwarded to an image analysis unit configured to ascertain surface anomalies as defect areas and delimit, if required, the defect areas in a segmentation relative to one another or against the image background, to summarize defect areas belonging together in a regional analysis, to derive characteristic defects from defect areas or defect regions in a feature extraction or both.