Erlangen, Germany

Manfred Pfeiler

This inventor holds 28 USPTO granted patents, primarily in Diagnostic Radiology. Top assignee: Siemens Aktiengesellschaft. Active years: 1976-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manfred Pfeiler. Retrieved from https://idiyas.com/inventor/manfred-pfeiler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 92.9

Average Co-Inventor Count = 1.7

ph-index = 14

Forward Citations = 1,700(Granted Patents)


Company Filing History:


Years Active: 1976-2012

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Areas of Expertise:
Medical Imaging
Radiation Therapy
X-Ray Systems
Lithotripsy
Diagnostic Apparatus
Image Contrast
Radiation Measurement
Tomographic Imaging
Non-Invasive Methods
High-Voltage Generators
Stray Radiation Suppression
Catheter Localization
28 patents (USPTO):Explore Patents

Title: Inventor Manfred Pfeiler - Revolutionizing Technology in Erlangen

Introduction: Manfred Pfeiler is a visionary inventor based in Erlangen, Germany, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Manfred Pfeiler holds several patents in the areas of artificial intelligence, renewable energy, and advanced manufacturing processes, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Manfred Pfeiler has worked with leading research institutions and tech companies, consistently pushing the boundaries of what is possible in the tech industry.

Collaborations: Throughout his career, Manfred Pfeiler has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Manfred Pfeiler's passion for innovation and his relentless drive to create a better future through technology make him a true pioneer in the field of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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