This inventor holds 1 USPTO granted patent. Top assignees: Anton Paar Kg, Other. Active years: 1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1986
Title: Manfred Krenn: Innovator in Micro Hardness Testing Technology
Introduction
Manfred Krenn is a notable inventor based in Feldkirchen, Austria. He is recognized for his contributions to the field of micro hardness testing technology. With a focus on precision and innovation, Krenn has developed a unique device that enhances the accuracy of hardness measurements.
Latest Patents
Krenn holds a patent for a micro hardness testing device, which is designed to measure the hardness of materials with high precision. The device features a permanent magnet with a plunger, a spring arrangement equipped with at least one strain gauge, and a penetration body that is loadable via the spring arrangement. The strain gauge provides a signal upon bending, which is converted into an electrical signal for measuring the force applied to the penetration body. This innovative design allows for the device to be inserted into a revolvable nose piece of a microscope, making it highly adaptable for various applications.
Career Highlights
Throughout his career, Manfred Krenn has worked with Anton Paar GmbH, a company known for its advanced measurement and analysis technology. His experience in this esteemed organization has contributed significantly to his expertise in the field of micro hardness testing.
Collaborations
Krenn has collaborated with notable professionals in his field, including Gerhard Raffer and Alfred Wagendristel. These collaborations have further enriched his work and contributed to advancements in micro hardness testing technology.
Conclusion
Manfred Krenn's innovative contributions to micro hardness testing technology exemplify his dedication to precision and advancement in the field. His patent and career achievements highlight the importance of innovation in scientific measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile