The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 1986
Filed:
Mar. 15, 1985
Manfred Krenn, Feldkirchen, AT;
Gerhard Raffer, Graz, AT;
Alfred Wagendristel, Perchtoldsdorf, AT;
Herwig Bangert, Vienna, AT;
Anton Paar, KG, Graz, AT;
Other;
Abstract
A micro hardness testing device (durometer) comprises a permanent magnet having a plunger. A spring arrangement has at least one strain gauge that provides a signal on bending of the spring arrangement. The spring arrangement is carried by the plunger. A penetration body is loadable via the spring arrangement, and the plunger is connected to a current supply. The strain gauge signal is converted to an electrical signal as a measuring signal for the force applied to the penetration body. The measuring signal is supplied to an evaluation unit. The plunger, the permanent magnet and the spring arrangement are enclosed by a housing adapted for insertion into a revolvable nose piece of a microscope. The housing approximates the shape and dimensions of an objective insert for the microscope. The penetration body is adjustable in an optical axis of the microscope.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile