This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Manfred Biehl: Innovator in Microtomy Technology
Introduction
Manfred Biehl is a notable inventor based in Meckesheim, Germany. He has made significant contributions to the field of microtomy, particularly with his innovative designs that enhance the functionality and usability of microtomy devices. His work is characterized by a focus on improving accessibility and operational control.
Latest Patents
Manfred Biehl holds a patent for a microtomy device that features a microtome and a thermostatically controlled refrigeration system. This system is controllable by a microprocessor and is housed within an instrument cabinet. The design includes a movable cover that provides an inspection window, which is equipped with a slidable transparent pane. This pane is not only heatable but can also be removed or shifted to facilitate cleaning. The improvements in this device offer enhanced accessibility to the instrument's interior and better control over its operations. He has 1 patent to his name.
Career Highlights
Throughout his career, Manfred Biehl has demonstrated a commitment to advancing microtomy technology. His innovative designs have set new standards in the industry, making microtomy devices more user-friendly and efficient. His work has been instrumental in improving the precision and reliability of microtomy processes.
Collaborations
Manfred has collaborated with notable colleagues such as Gernot Hansel and Hans Ludwid Heid. These partnerships have contributed to the development of advanced technologies in the field of microtomy.
Conclusion
Manfred Biehl's contributions to microtomy technology reflect his dedication to innovation and improvement. His patented designs continue to influence the industry, showcasing the importance of accessibility and control in scientific instruments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile