The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 1990
Filed:
Oct. 06, 1989
Manfred Biehl, D-6922 Meckesheim, DE;
Gernot Hansel, D-7000 Stuttgart 70, DE;
Hans Heid, D-6901 Bammental, DE;
Manfred Kempe, D-6903 Neckargemund, DE;
Dieter Teppke, D-6830 Schwetzingen, DE;
Jurgen Vierling, D-6904 Eppelheim, DE;
Other;
Abstract
An improve microtomy device is disclosed comprising a microtome and a thermostatically controlled refrigeration means controllable by a microprocessor and accommodated in an instrument cabinet, the improvement comprising, providing an upper part of the instrument cabinet in the form of a movable cover, which cover encloses a slidable transparent pane arranged above the microtome to define an inspection window disposed in a front portion of the cover. The pane is heatable and can be removed from the cover and/or shifted into a rearward portion of the cover to open the inspection window for cleaning purposes. The improved device provides convenient accessibility to the interior of the instrument and improved control of operations.