Noida, India

Maneesh Agarwal

This inventor holds 1 USPTO granted patent. Top assignee: Cadence Design Systems, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maneesh Agarwal. Retrieved from https://idiyas.com/inventor/maneesh-agarwal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Maneesh Agarwal: Innovator in Code Coverage Mapping

Introduction

Maneesh Agarwal is a notable inventor based in Noida, India. He has made significant contributions to the field of software engineering, particularly in the area of code coverage mapping. His innovative approach has led to the development of methods and systems that enhance the efficiency of code testing.

Latest Patents

Maneesh Agarwal holds a patent for "Code Coverage Mapping." This patent describes methods for generating a source-code handle corresponding to a transaction code. The process involves communicating this handle through an interface to a server that emulates a design-under-test (DUT). The invention facilitates marking the start of execution of one or more sequences of instructions of the transaction code by writing a value of the source-code handle to a signal in the DUT.

Career Highlights

Maneesh Agarwal is currently employed at Cadence Design Systems, Inc., where he continues to work on innovative solutions in software development. His expertise in code coverage mapping has positioned him as a valuable asset in his field.

Collaborations

Maneesh collaborates with his coworker, Prashant Vardhan Agarwal, to further advance their projects and contribute to the success of their team.

Conclusion

Maneesh Agarwal's contributions to code coverage mapping exemplify his commitment to innovation in software engineering. His work not only enhances the testing process but also sets a foundation for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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