This inventor holds 1 USPTO granted patent. Top assignee: Yokowo Co., Ltd.. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: The Innovative Contributions of Makoto Nakakoji
Introduction
Makoto Nakakoji is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of electronics, particularly in the development of testing equipment. His innovative approach has led to advancements that enhance the reliability and efficiency of electronic testing processes.
Latest Patents
One of Nakakoji's notable patents is for a "Capacity load type probe, and test jig using the same." This invention involves a metal block that houses multiple probes, including signal and power supply probes. Each probe features a movable pin that can project from the surface of the metal block, allowing for variable projection lengths. This design enables effective testing of device under test (DUT) characteristics by ensuring contact between electrode terminals and probe tips. The capacity loaded probe, which includes a capacitor, effectively reduces noise and minimizes voltage drop at the power supply terminal during output changes.
Career Highlights
Makoto Nakakoji has made significant strides in his career, working with Yokowo Co., Ltd., a company recognized for its innovative electronic solutions. His work has not only contributed to the company's success but has also positioned him as a key figure in the field of electronic testing.
Collaborations
Throughout his career, Nakakoji has collaborated with talented individuals such as Wasuke Yanagisawa and Ryo Horie. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies.
Conclusion
In summary, Makoto Nakakoji's contributions to the field of electronics through his innovative patents and collaborations have made a lasting impact. His work continues to influence the industry, paving the way for future advancements in electronic testing technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
