The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2007
Filed:
Feb. 06, 2003
Wasuke Yanagisawa, Tokyo, JP;
Makoto Nakakoji, Tokyo, JP;
Ryo Horie, Tokyo, JP;
Takuto Yoshida, Tokyo, JP;
Wasuke Yanagisawa, Tokyo, JP;
Makoto Nakakoji, Tokyo, JP;
Ryo Horie, Tokyo, JP;
Takuto Yoshida, Tokyo, JP;
Yokowo Co., Ltd., Tokyo, JP;
Abstract
A plurality of probes such as a signal probe () and a power supply probe () are provided into a metal block () so as to penetrate. Each of the probes has a movable pin (). A tip of the movable pin is projecting from one surface of the metal block (). And a projection length of the tip is variable. A DUTis pressed onto the surface of the metal block () to contact between electrode terminals (to) and tips of the probes to test characteristics of the DUT. At least one of the probes is capacity loaded probe having a capacitor by providing a dielectric layer and a metal film to peripheral of the probe. As a result, noise can be removed reliably. Additionally, when the capacity loaded probe is used as the power supply probe, a voltage drop is reduced at the power supply terminal in a case of change of the output.