Company Filing History:

24 out of 39,228

Fujitsu Corporation

patents

2 out of 1,674

Fujitsu Semiconductor Limited

patents

Years Active: 2000-2014

where 'Filed Patents' based on already Granted Patents

26 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 8759119 - Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state (2014-06-24),

2. 8404496 - Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state (2013-03-26),

3. 7304487 - Test method of semiconductor devices (2007-12-04),

4. 7196530 - Device testing contactor, method of producing the same, and device testing carrier (2007-03-27),

5. 7174629 - Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor (2007-02-13),

6. 7161370 - Semiconductor testing device (2007-01-09),

7. 7112889 - Semiconductor device having an alignment mark formed by the same material with a metal post (2006-09-26),

8. 7028398 - Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor (2006-04-18),

9. 6975126 - Contactor apparatus for semiconductor devices and a test method of semiconductor devices (2005-12-13),

10. 6882169 - Semiconductor testing device (2005-04-19),

11. 6781395 - Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor (2004-08-24),

12. 6661247 - Semiconductor testing device (2003-12-09),

13. 6643922 - Device testing contactor, method of producing the same, and device testing carrier (2003-11-11),

14. 6630839 - Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor (2003-10-07),

15. 6624645 - Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection (2003-09-23),

Title: Makoto Haseyama: Innovator in Semiconductor Technology

Introduction

Makoto Haseyama is a prominent inventor based in Kawasaki, Japan, known for his significant contributions to semiconductor technology. With an impressive portfolio of 26 patents, his work has played a crucial role in advancing testing methods and enhancing the functionality of semiconductor devices.

Latest Patents

Among his latest innovations, Haseyama introduced a method of testing a semiconductor device and suctioning a semiconductor device in the wafer state. This invention features an alignment mark that can be recognized by conventional wafer probers, providing a more streamlined testing process. The semiconductor device also includes a redistribution layer that connects its electrodes to electrode pads in predetermined positions. Additionally, metal posts with external connection electrodes are formed on these pads, along with a mark member made of the same material as the metal posts. This unique alignment mark is situated in a specific positional relationship with the metal posts, improving the precision of semiconductor testing.

Career Highlights

Haseyama has built a remarkable career, having worked with leading companies in the technology sector. He has been associated with Fujitsu Corporation and Fujitsu Semiconductor Limited, where he has developed numerous innovations that have impacted the semiconductor industry. His dedication to research and development has been integral to the progress made within his field.

Collaborations

Throughout his career, Haseyama has collaborated with esteemed colleagues such as Shigeyuki Maruyama and Futoshi Fukaya. These partnerships have fostered a creative environment that has led to the successful development of groundbreaking technologies.

Conclusion

Makoto Haseyama stands out as an influential figure in the realm of semiconductor innovations. His extensive patent portfolio and collaborative efforts with leading professionals showcase his commitment to enhancing technology in the semiconductor industry. As advancements continue to evolve, the impact of Haseyama's inventions will undoubtedly resonate within the technology landscape for years to come.

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