San Jose, CA, United States of America

Lunyu Ma


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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2 patents (USPTO):Explore Patents

Title: Lunyu Ma: Innovator in Probe Card Technology

Introduction

Lunyu Ma is a notable inventor based in San Jose, CA, who has made significant contributions to the field of probe card technology. With a total of 2 patents, he has developed innovative methods and apparatuses that enhance the efficiency and accuracy of testing devices.

Latest Patents

One of Lunyu Ma's latest patents is titled "Method and apparatus for adjusting a multi-substrate probe structure." This invention involves a probe card assembly that comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, these sets form an array of probes designed for contacting a device to be tested. The adjustment mechanisms in this invention are configured to impart forces to each probe substrate, allowing for individual movement with respect to the mounting assembly. These mechanisms can translate each probe substrate in the 'x,' 'y,' and 'z' directions and can also rotate each substrate. Furthermore, they can change the shape of one or more probe substrates, enabling precise alignment and planarization with respect to the contacts on the device being tested.

Career Highlights

Lunyu Ma is currently employed at FormFactor, Inc., where he continues to innovate in the field of probe card technology. His work has been instrumental in advancing the capabilities of testing equipment, making it more adaptable and efficient.

Collaborations

Lunyu has collaborated with notable coworkers such as Eric D. Hobbs and Benjamin N. Eldridge, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Lunyu Ma's contributions to probe card technology through his patents and work at FormFactor, Inc. highlight his role as a significant inventor in the field. His innovative approaches continue to impact the efficiency of device testing, showcasing the importance of his work in the industry.

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