This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Innovations by Luis Carlos Medina
Introduction
Luis Carlos Medina is an accomplished inventor based in Lago Vista, TX (US). He has made significant contributions to the field of technology, particularly in the area of Logic Built-In Self-Test (LBIST). His innovative approach has led to the development of a unique patent that enhances the efficiency and effectiveness of LBIST systems.
Latest Patents
Luis Carlos Medina holds a patent titled "System and method for improved LBIST power and run time." This patent describes a method for improved Logic Built-In Self-Test (LBIST) that includes providing a plurality of control signal sets by an LBIST controller to an LBIST domain comprising multiple LBIST satellite modules. Each satellite module receives an individual control signal set, allowing for interleaved LBIST channel scan and sequence operations. This innovative method significantly optimizes the testing process in electronic systems.
Career Highlights
Luis Carlos Medina is associated with International Business Machines Corporation (IBM), where he applies his expertise in developing advanced testing methodologies. His work at IBM has positioned him as a key player in enhancing the reliability and performance of electronic devices through innovative testing solutions.
Collaborations
Throughout his career, Luis has collaborated with notable colleagues, including Hien Le and Robert Christopher Dixon. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Luis Carlos Medina's contributions to the field of technology through his patent and work at IBM exemplify the spirit of innovation. His advancements in LBIST technology are paving the way for more efficient electronic testing methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
