The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Oct. 03, 2007
Hien Minh Le, Cedar Park, TX (US);
Robert Christopher Dixon, Austin, TX (US);
Luis Carlos Medina, Lago Vista, TX (US);
Tung Nguyen Pham, Austin, TX (US);
Hien Minh Le, Cedar Park, TX (US);
Robert Christopher Dixon, Austin, TX (US);
Luis Carlos Medina, Lago Vista, TX (US);
Tung Nguyen Pham, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets. A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.