Hefei, China

Lufeng Ding

This inventor holds 1 USPTO granted patent. Top assignee: University of Science and Technology of China. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lufeng Ding. Retrieved from https://idiyas.com/inventor/lufeng-ding

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Lufeng Ding: Innovator in Three-Dimensional Microscopy

Introduction

Lufeng Ding is a prominent inventor based in Hefei, China. He has made significant contributions to the field of microscopy, particularly with his innovative approach to three-dimensional imaging. His work is recognized for enhancing the capabilities of traditional microscopy techniques.

Latest Patents

Lufeng Ding holds a patent for a "Microscope having three-dimensional imaging capability and three-dimensional microscopic imaging method." This invention includes at least one excitation device designed to generate a detectable contrast in a detection target region of a sample. The microscope features a detection device that captures the contrast generated from the sample and a movement mechanism that allows for relative movement of the sample in a unique direction, enhancing the imaging process.

Career Highlights

Lufeng Ding is affiliated with the University of Science and Technology of China, where he continues to advance research in microscopy. His innovative work has positioned him as a key figure in the development of advanced imaging techniques.

Collaborations

He has collaborated with notable colleagues, including Qianru Yang and Pak-Ming Lau, contributing to the advancement of research in their field.

Conclusion

Lufeng Ding's contributions to three-dimensional microscopy exemplify the innovative spirit of modern inventors. His work not only enhances scientific research but also paves the way for future advancements in imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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