The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Apr. 25, 2019
University of Science and Technology of China, Hefei, CN;
Qingyuan Zhu, Hefei, CN;
Guoqiang Bi, Hefei, CN;
Hao Wang, Hefei, CN;
Pak-Ming Lau, Hefei, CN;
Lufeng Ding, Hefei, CN;
Chaoyu Yang, Hefei, CN;
Qianru Yang, Hefei, CN;
Dasheng Bi, Hefei, CN;
Qi Xin, Hefei, CN;
University of Science and Technology of China, Anhui, CN;
Abstract
A microscope having three-dimensional imaging capability and a three-dimensional microscopic imaging method are provided, the microscope including: at least one excitation device configured to generate a detectable contrast in a detection target region of a sample which is to be detected, in an excitation principal axis direction; at least one detection device, configured to detect the contrast as generated from the detection target region of the sample in a detection principal axis; and at least one movement mechanism, configured to generate a relative movement of the sample relative to the excitation device and the detection device; the relative movement is in a direction neither parallel to nor perpendicular to the excitation principal axis direction or the detection principal axis direction.