Luciano P DosSantos

Title: The Innovations of Luciano P DosSantos

Introduction

Luciano P DosSantos is a notable inventor based in Danbury, CT (US). He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique patent that enhances the efficiency of backside emission testing for silicon wafers.

Latest Patents

Luciano holds a patent for a "Probe station adapter for backside emission inspection." This invention describes an adapter designed to hold a silicon wafer in an inverted position on a probe station. The adapter allows for backside emission testing while the wafer is energized and probed beneath the carrier. This advancement is crucial for improving the accuracy and reliability of semiconductor testing processes. He has 1 patent to his name.

Career Highlights

Luciano is currently employed at Wentworth Laboratories Limited, where he applies his expertise in semiconductor technology. His role involves developing innovative solutions that address the challenges faced in the industry. His work has been instrumental in advancing the capabilities of testing equipment used in semiconductor manufacturing.

Collaborations

Luciano has collaborated with several talented individuals in his field, including John Brown and Matthew J Costello. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Luciano P DosSantos is a distinguished inventor whose contributions to semiconductor technology have made a lasting impact. His innovative patent for a probe station adapter exemplifies his commitment to advancing the field. Through his work at Wentworth Laboratories Limited and collaborations with fellow professionals, he continues to push the boundaries of what is possible in semiconductor testing.