Bolton Valley, VT, United States of America

Lu'ay Bakir

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lu'ay Bakir. Retrieved from https://idiyas.com/inventor/lu-ay-bakir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Lu'ay Bakir: Innovator in Integrated Circuit Design

Introduction

Lu'ay Bakir is a notable inventor based in Bolton Valley, VT (US). He has made significant contributions to the field of integrated circuit design, particularly in the area of electrostatic discharge (ESD) protection.

Latest Patents

Lu'ay Bakir holds a patent for a "Method for placing electrostatic discharge clamps within integrated circuit devices." This innovative method involves defining a region within an integrated circuit design, generating a list of ESD-susceptible circuits, and strategically placing an ESD protection device at the center of gravity of these circuits. The process ensures that all ESD-susceptible circuits are adequately protected, enhancing the reliability of integrated circuits.

Career Highlights

Lu'ay Bakir is associated with International Business Machines Corporation (IBM), where he applies his expertise in integrated circuit design. His work focuses on improving the robustness of electronic devices against electrostatic discharge, which is crucial for maintaining device integrity.

Collaborations

Throughout his career, Lu'ay has collaborated with esteemed colleagues such as Ciaran J Brennan and Joseph N Kozhaya. These collaborations have contributed to advancements in the field of integrated circuit technology.

Conclusion

Lu'ay Bakir's innovative approach to ESD protection in integrated circuits showcases his commitment to enhancing electronic device reliability. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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