This inventor holds 1 USPTO granted patent. Top assignee: Ecole Polytechnique Federale De Lausanne. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Loïc Arnaud Baboulaz: Innovator in Reflectance Measurement Technology
Introduction
Loïc Arnaud Baboulaz is a notable inventor based in Lausanne, Switzerland. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on devices that enhance the understanding of light interaction with various subjects.
Latest Patents
Loïc Arnaud Baboulaz holds a patent for a "Device for determining a bidirectional reflectance distribution function of a subject." This device includes a light source that produces incident light directed onto a subject at predetermined zenith and azimuth angles. It features an element for displacing the light source around a hemispherical area centered on the subject. Additionally, it has a measurement element that captures the bidirectional reflectance distribution function from a fixed location aligned with the subject's normal direction. The control unit manages the displacement and measurement elements, allowing for precise adjustments.
Career Highlights
Loïc Arnaud Baboulaz is affiliated with the École Polytechnique Fédérale de Lausanne, a prestigious institution known for its research and innovation. His work at this institution has allowed him to explore advanced optical technologies and contribute to the scientific community.
Collaborations
He has collaborated with notable colleagues such as Gaël Georges Soudan and Martin Vetterli. These partnerships have fostered a collaborative environment that enhances research and innovation in their respective fields.
Conclusion
Loïc Arnaud Baboulaz is a distinguished inventor whose work in reflectance measurement technology has made a significant impact. His innovative device and collaborations reflect his commitment to advancing optical measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
