This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National Detudes Spatiales, Exail. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 316 
1 out of 24 Years Active: 2026
Title: Louis Lhomme: Innovator in Interferometry
Introduction
Louis Lhomme is a notable inventor based in Saint-Germain-en-Laye, France. He has made significant contributions to the field of interferometry, particularly through his innovative methods aimed at enhancing measurement accuracy.
Latest Patents
Lhomme holds a patent for a method designed to reduce the Kerr effect in an interferometry measuring device. This patent, titled "Method for reducing the Kerr effect in an interferometry measuring device, and interferometry measuring device configured to implement this method," outlines a process that involves determining and cancelling phase shifts between counterpropagating signals in a Sagnac interferometer. The method ultimately adjusts the power ratio of these signals to ensure precise measurements.
Career Highlights
Throughout his career, Louis Lhomme has worked with esteemed organizations such as the Centre National d'Études Spatiales and Exail. His experience in these institutions has allowed him to refine his expertise in optical measurements and interferometry.
Collaborations
Lhomme has collaborated with notable colleagues, including Eric Ducloux and Nicolas Grossard. These partnerships have contributed to advancements in the field and have fostered a collaborative environment for innovation.
Conclusion
Louis Lhomme's work in interferometry exemplifies the impact of innovative thinking in scientific measurement. His contributions continue to influence the field and enhance the accuracy of optical devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile