The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Mar. 03, 2022
Exail, Saint-Germain-en-Laye, FR;
Centre National D'etudes Spatiales, Paris, FR;
Eric Ducloux, Saint-Germain-en-Laye, FR;
Louis Lhomme, Saint-Germain-en-Laye, FR;
Nicolas Grossard, Saint-Germain-en-Laye, FR;
Jérôme Hauden, Saint-Germain-en-Laye, FR;
EXAIL, Saint-Germain-en-Laye, FR;
CENTRE NATIONAL D'ETUDES SPATIALES, Paris, FR;
Abstract
Disclosed is a method for reducing the Kerr effect in an interferometry measuring device including a generator configured to emit an input periodic light signal, and a Sagnac interferometer in which two counterpropagating signals travel and combine so as to form a periodic output signal having at least two power values, the method including: determining a phase shift between the two counterpropagating signals a first time, and cancelling out the phase shift; and then determining a phase shift between the two counterpropagating signals a second time; and adjusting the ratio between the average powers of the counterpropagating signals so as to cancel out the value of the phase shift determined in the second determination. Also disclosed is an interferometry measuring device configured to implement such method.