Lyons, France

Louis Jolibois

This inventor holds 1 USPTO granted patent. Top assignee: Datadog, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Louis Jolibois. Retrieved from https://idiyas.com/inventor/louis-jolibois

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Louis Jolibois and Event-Metric Deduplication

Introduction

Louis Jolibois is an inventor associated with Datadog, Inc. and based in Lyons, France. His patent work addresses a challenge in monitoring systems: preventing events from being counted more than once when calculating metrics.

Latest Patents

Jolibois is associated with 1 patent, titled “Duplication Avoidance for Mutable Event Based Metrics.” The invention describes assigning a unique identifier to each monitoring event that matches a metric definition. Below a predetermined threshold, a hash set helps determine whether an event’s identifier duplicates one already assigned to another event. Once the number of identifiers exceeds that threshold, the system adds them to a probabilistic data structure, such as a scalable Bloom filter, and checks for duplicates there. This approach is designed to support deduplication as the volume of monitoring events grows.

Career Highlights

Jolibois’s disclosed invention focuses on reliable metric generation from monitoring events received from endpoints, including web browsers and mobile applications. Its use of different data structures at different identifier volumes offers a way to manage duplicate checks as event data scales.

Collaborations

Jolibois’s listed coworkers include Emmanuel Manousack Tran and Amina Bouabdallah. The patent is associated with Datadog, Inc.

Conclusion

Louis Jolibois’s patent presents a scalable approach to avoiding duplicate counts in event-based metrics, contributing to more reliable monitoring data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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