The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Nov. 14, 2023
Applicant:

Datadog, Inc., New York, NY (US);

Inventors:

Karim Bogtob, Cournon D'auvergne, FR;

Emmanuel Manousack Tran, Paris, FR;

Amina Bouabdallah, Compiègne, FR;

Louis Jolibois, Lyons, FR;

Assignee:

Datadog, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3075 (2013.01); G06F 11/3082 (2013.01);
Abstract

The technology disclosed herein provides a mechanism to avoid double counting when generating metrics from monitoring events received from an endpoint (e.g., end user's web browser, or mobile application). A unique identifier is assigned to each monitoring event matching a metric definition. When the number of unique identifiers assigned is below a predetermined threshold, a deduplication system determines whether the unique identifier for a given monitoring event is duplicative of any other unique identifiers, corresponding to other monitoring events, using a hash set. When the number of unique identifiers exceeds the predetermined threshold, the unique identifiers are automatically added to a probabilistic data structure, such as a scalable Bloom filter. In this scenario, the deduplication system would determine whether the unique identifier for the given monitoring event is duplicative of any other identifiers in the probabilistic data structure.


Find Patent Forward Citations

Bogtob, Karim. (2026). Duplication avoidance for mutable event based metrics (U.S. Patent No. 12724686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12724686

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…