Compiègne, France

Amina Bouabdallah

This inventor holds 1 USPTO granted patent. Top assignee: Datadog, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amina Bouabdallah. Retrieved from https://idiyas.com/inventor/amina-bouabdallah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Amina Bouabdallah and Event-Metric Deduplication

Introduction

Amina Bouabdallah is an inventor associated with Compiègne, France, and Datadog, Inc. Her patent work addresses a challenge in monitoring systems: preventing the same event from being counted more than once when metrics are generated.

Latest Patents

Bouabdallah is associated with one patent, titled “Duplication Avoidance for Mutable Event Based Metrics.” The disclosed technology assigns a unique identifier to each monitoring event that matches a metric definition. Below a predetermined threshold, a hash set is used to check whether an identifier duplicates one already assigned to another event. Above that threshold, identifiers are added to a probabilistic data structure, such as a scalable Bloom filter, which is then used to check for duplicates. This approach is designed to support accurate metric generation as the volume of monitoring events grows.

Career Highlights

Bouabdallah’s listed patent reflects work on scalable event processing and reliable monitoring metrics. Her association with Datadog connects this invention to software for monitoring applications and digital services. The patent record lists 1 patent for her.

Collaborations

The provided information names Karim Bogtob and Emmanuel Manousack Tran as Bouabdallah’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Amina Bouabdallah’s patent focuses on reducing duplicate counts in event-based metrics by combining hash-set checks with probabilistic data structures, offering a scalable approach to monitoring data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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