Poughkeepsie, NY, United States of America

Louis H Faure


Average Co-Inventor Count = 2.0

ph-index = 8

Forward Citations = 124(Granted Patents)


Company Filing History:


Years Active: 1977-1998

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10 patents (USPTO):

Title: Innovations of Louis H. Faure

Introduction

Louis H. Faure is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of testing probes, holding a total of 10 patents. His work focuses on enhancing the functionality and reliability of testing apparatuses.

Latest Patents

One of his latest patents is a method of making a spring probe with piloted and headed contact. This innovation involves testing probes supported in a unitary structure, providing rigidity for the probes during testing. The spring probes feature a contact head at the distal end from the probe tip, equipped with antirotation tabs that lock into a cooperating antirotation slot in the probe guide. The contact head includes a cone-shaped pilot at its tip, which engages with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot through mechanical engagement or bonding methods such as soldering or laser welding. Another method he developed involves forming a probe tip on an array of test probes within a support member of a test apparatus. This process includes inserting multiple probes into an array of probe cylinders, retaining them at predetermined positions, and planarizing the ends of the probes to create a smooth surface.

Career Highlights

Louis H. Faure has had a distinguished career at International Business Machines Corporation (IBM). His innovative work has significantly impacted the design and functionality of testing equipment, making him a valuable asset to the company.

Collaborations

He has collaborated with notable coworkers such as Terence W. Spoor and Dana Roberts Townsend, contributing to advancements in their respective fields.

Conclusion

Louis H. Faure's contributions to the field of testing probes exemplify his innovative spirit and dedication to improving technology. His patents reflect a commitment to enhancing the efficiency and reliability of testing apparatuses.

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