The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1977

Filed:

Oct. 04, 1976
Applicant:
Inventors:

Charles Paul Coughlin, Chelsea, NY (US);

Louis Henry Faure, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; B27G / ;
U.S. Cl.
CPC ...
3318 / ; 33 / ; 3317 / ; 3318 / ;
Abstract

Disclosed is a method of aligning a plurality of probes to a plurality of contacts, the contacts being arragned in a pattern on a substrate. The method includes the steps of powering one of a selected pattern of probes or a like pattern of selected contacts such that upon the selected patterns being in coincidence, the plurality of probes will be in contact with predetermined contacts on the substrate. This is accomplished by providing a circuit path through all of the other probes or contacts which are not powered and then bringing the plurality of probes into contact at random with the contacts of the substrate and then moving one of the substrate and probes until the selected patterns coincide as by indication of a completed circuit path between selected patterns.


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