Lorraine Ellen Young

Title: Lorraine Ellen Young: Innovator in Electron Beam Inspection Technology

Introduction

Lorraine Ellen Young is a prominent inventor based in San Jose, California. She has made significant contributions to the field of electron beam inspection technology. Her innovative work has led to the development of advanced methods for defect detection, which are crucial in various industries.

Latest Patents

Lorraine holds a patent for "Enhanced defect detection in electron beam inspection and review." This invention involves an electron beam apparatus designed for inspection and review purposes. The apparatus includes an electron source that generates a primary electron beam, along with an electron-optics system that shapes and focuses this beam onto a sample. A detection system is employed to capture signal-carrying electrons, including secondary and back-scattered electrons from the sample. Additionally, an image processing system processes the data collected by the detection system. The host computer system coordinates the operations of the electron-optics system, detection system, and image processing system. A graphical user interface allows users to select and activate operating parameters of the apparatus. This patent represents a significant advancement in the field of electron beam technology.

Career Highlights

Lorraine is currently associated with KLA-Tencor Corporation, where she applies her expertise in electron beam inspection technology. Her work has been instrumental in enhancing the capabilities of inspection systems used in various applications. Lorraine's dedication to innovation has positioned her as a key figure in her field.

Collaborations

Throughout her career, Lorraine has collaborated with talented individuals such as Gary Fan and Kumar Raja Guvindan Raju. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies.

Conclusion

Lorraine Ellen Young's contributions to electron beam inspection technology exemplify her commitment to innovation and excellence. Her patent for enhanced defect detection showcases her ability to address complex challenges in the field. Lorraine continues to inspire future generations of inventors and engineers with her groundbreaking work.