Shenzhen, China

Longjun Cheng

This inventor holds 1 USPTO granted patent. Top assignee: Chotest Technology Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Longjun Cheng. Retrieved from https://idiyas.com/inventor/longjun-cheng-al16e86m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Longjun Cheng: Inventor in Shenzhen

Introduction

Longjun Cheng is an inventor based in Shenzhen, China, associated with Chotest Technology Inc. His patent work includes a method for assessing the orthogonality of an orthogonal axis system.

Latest Patents

Cheng is named on one patent, titled “Method for Measuring Orthogonality of Orthogonal Axis System.” The method places an instrument on a bearing surface and measures virtual cross sections of a rotary axis before and after rotation. By comparing the geometric centers of those cross sections, it determines whether the orthogonality between two rotary axes meets specified requirements. The approach provides a measurement procedure for evaluating the alignment of an axis system.

Career Highlights

Cheng’s listed patent activity focuses on measurement and the evaluation of rotary-axis alignment. His work is associated with Chotest Technology Inc., a company connected to the development of measurement technologies.

Collaborations

Cheng’s listed coworkers include Zhiwei Zhang and Yuan Chen. Their names are provided as professional associations, though the available information does not specify their roles in the patent.

Conclusion

Longjun Cheng’s recorded invention addresses a practical measurement challenge by using cross-section measurements to assess rotary-axis orthogonality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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