The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 22, 2021
Applicant:

Chotest Technology Inc., Shenzhen, CN;

Inventors:

Zhiwei Zhang, Shenzhen, CN;

Yuan Chen, Shenzhen, CN;

Hejun Zhang, Shenzhen, CN;

Furong Feng, Shenzhen, CN;

Xuewen Liao, Shenzhen, CN;

Longjun Cheng, Shenzhen, CN;

Assignee:

CHOTEST TECHNOLOGY INC., Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 21/22 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 21/22 (2013.01); G01B 21/04 (2013.01);
Abstract

Some embodiments of the disclosure provide a method for measuring orthogonality of an orthogonal axis system, In some examples, the method includes following steps: placing an instrument on a bearing surface, intercepting a second rotary axis along an interception plane to obtain a first virtual cross section of the second rotary axis, and measuring the first virtual cross section to obtain a geometric center of the first virtual cross section as a first position; rotating a first rotary device to enable the second rotary axis to rotate with a preset angular degree, and measuring the second virtual cross section to obtain a geometric center of the second virtual cross section as a second position; and determining whether the orthogonality between the first rotary axis and the second rotary axis meets requirements or not on the basis of the first position and the second position.


Find Patent Forward Citations

Zhang, Zhiwei. (2026). Method for measuring orthogonality of orthogonal axis system (U.S. Patent No. 12754015). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754015

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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