Longhai Liu

Title: Longhai Liu: Innovator in Real-Time Measurement Technology

Introduction

Longhai Liu is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on the development of devices that enhance the accuracy and efficiency of measuring phase retardation in birefringent materials.

Latest Patents

Liu holds a patent for a device and method for measuring phase retardation distribution and fast axis azimuth angle distribution in real time. This invention is designed to measure the phase retardation distribution and the fast axis azimuth angle distribution of birefringent samples in real time. The device comprises a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge-coupled device (CCD) image sensor, and a computer with an image acquisition card. The method allows for a large measurement range and ensures that the results are immune to fluctuations in light intensity from the light source.

Career Highlights

Longhai Liu is affiliated with the Chinese Academy of Sciences, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

Liu has collaborated with notable colleagues, including Huijie Huang and Linglin Zhu, contributing to the advancement of their shared research interests.

Conclusion

Longhai Liu's innovative contributions to real-time measurement technology exemplify the impact of dedicated research and development in the field of optics. His work continues to influence advancements in measurement techniques and applications.