Lok Ping Ho

Title: Innovations by Lok Ping Ho in Semiconductor Detection

Introduction

Lok Ping Ho is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on the detection of atomic scale defects in semiconductors, which is crucial for the fabrication of high-quality electronic devices.

Latest Patents

Lok Ping Ho holds a patent for a luminescence method designed for the in-line detection of atomic scale defects during the fabrication of 4H—SiC diodes. This method involves scanning the surface of the semiconductor with a field emission scanning electron microscope (SEM) to create an SEM image. The SEM image is then analyzed using a light detector and monochromator to obtain a cathodoluminescence (CL) spatial intensity map. The CL spectra are determined, and the CL intensity is compared to a threshold to identify defective semiconductors. This innovative approach enhances the quality control processes in semiconductor manufacturing.

Career Highlights

Lok Ping Ho is affiliated with The University of Hong Kong, where he continues to advance research in semiconductor technologies. His work has implications for improving the reliability and performance of electronic devices.

Collaborations

He collaborates with esteemed colleagues such as Chi Chung Francis Ling and Sihua Li, contributing to a dynamic research environment focused on semiconductor innovations.

Conclusion

Lok Ping Ho's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the field. His work not only enhances the understanding of atomic scale defects but also improves the manufacturing processes of semiconductors.