Beijing, China

Liudi Wang


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2017

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Liudi Wang: Innovator in Memory Testing Technology

Introduction

Liudi Wang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of memory testing technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of memory sequential tests.

Latest Patents

Liudi Wang holds a patent for a "Scan chain for memory sequential test." This invention outlines a method for constructing a scan chain specifically for memory sequential testing. The process involves determining an input boundary register of the memory and calculating the number of test vectors required based on the type of memory input pins connected to the input boundary register. The arrangement of the scan chain is designed to ensure that there are at least (N-1) continuous non-boundary registers adjacent to the input boundary register. Additionally, control signals are set for the input boundary register and the non-boundary registers to facilitate the reception of scan test input as test vectors during the memory sequential test mode. This patent showcases his expertise in optimizing memory testing processes.

Career Highlights

Liudi Wang is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in the field of memory testing. His dedication to innovation has positioned him as a valuable asset within the company.

Collaborations

Liudi Wang collaborates with talented colleagues, including Jixiang Hou and Hailong Li. Their combined expertise fosters a creative environment that drives technological advancements in their projects.

Conclusion

Liudi Wang is a distinguished inventor whose work in memory testing technology has made a significant impact. His patent for a scan chain method exemplifies his innovative spirit and commitment to enhancing memory testing processes. His contributions continue to shape the future of technology in this field.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…