The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Oct. 05, 2015
International Business Machines Corporation, Armonk, NY (US);
Jixiang Hou, Beijing, CN;
Hailong Li, Beijing, CN;
Li Min Liu, Beijing, CN;
Yin Peng Lu, Shanghai, CN;
Liudi Wang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for constructing a scan chain for a memory sequential test, including determining an input boundary register of the memory; determining a number N of test vectors required according to the type of the memory input pins to which the input boundary register is connected; arranging the scan chain based on the number N, such that in the scan chain, upstream of the input boundary register and immediately adjacent to the input boundary register, there are at least (N−1) continuous non-boundary registers; and setting control signals of the input boundary register and the (N−1) non-boundary registers to make them receive scan test input as test vectors under memory sequential test mode.